We made good use of the industrial computed tomography ( ict ) , scanning electronic micrograph ( sem ) and imaging analysis assemble to investigate the inner and surface fine structures of the cathode in quality and quantity 3 )采用ct微焦點(diǎn)系統(tǒng)等檢測(cè)手段對(duì)陰極基底的內(nèi)部和表面微觀結(jié)構(gòu)進(jìn)行了定量和定性的分析,有望成為控制陰極基底的質(zhì)量重要手段。