Study on heterodyne transmission ellipsometry and nonlinearity error 透射式外差橢偏測量及非線性誤差分析
Measurement of the electric - optic index of thin films by using modulated ellipsometry 利用調(diào)制式橢偏儀測量薄膜電光系數(shù)
Spectroscopic ellipsometry of sic si heterostructures formed by c implantation into crystalline silicon 異質(zhì)結構的橢偏光譜
Ellipsometry that is applied to lots of fields such as physics . chemistry . hylology 鑒于當前對該課題研究的不足,本論文對該課題進行了研究。
Vfsa application in ellipsometry data computing and the improvement tactics of the algorithm 非??焖倌M退火算法在橢偏數(shù)據(jù)處理中的應用及其改進策略研究
Azimuth , in ellipsometry - the angle measured between the plane of incidence and the major axis of the ellipse 橢圓方位角-測量入射面和主晶軸之間的角度。
Azimuth , in ellipsometry - the angle measured between the plane of incidence and the major axis of the ellipse 橢圓方位角-測主和面射入量晶軸之間的角度。
The deposited cu - mgf2 cermet films were analyzed by xrd , ed , tem , ir , uv , ellipsometry and temperature - varied four - wire technique 用ir 、 uv及橢圓偏振光譜技術測量分析樣品從紅外-近紫外波段的透射、吸收及反射光譜特性。
To this end , we have performed in situ ellipsometry measurements while etching through homogeneous , comparatively thick sige films of a known ge content 為此,我們實施了對于刻蝕均勻的比較厚的已知鍺濃度的鍺硅薄膜的同步橢偏測量。
Since ellipsometry is not sensitive to emission or absorption of light by the plasma , it is one of the few surface techniques that is compatible with a plasma environment 因為橢偏儀對等離子的光的發(fā)射和吸收不敏感,它是少數(shù)幾種與等離子環(huán)境相兼容的表面技術之一。
Ellipsometry is an optical technique for the investigation of the dielectric properties (complex refractive index or dielectric function) of thin films.