ellipsometer in Chinese
Translation
Mobile
- 偏振光橢圓計
- 偏振光橢圓率測量儀
- 橢率計
- 橢圓率計
- 橢圓偏振計
- "reflecto-ellipsometer" in Chinese : 反射式橢圓率測定儀
- "autocollimation-type ellipsometer" in Chinese : 自準(zhǔn)直型橢圓偏振計
- "ellipsometer oxide thickness measurement" in Chinese : 氧化物厚度的橢圓計測量
- "ellipsolithus" in Chinese : 橢圓顆石
- "ellipsometern" in Chinese : 橢圓計
- "ellipsoid,prolate" in Chinese : 長橢球
- "ellipsometers" in Chinese : 橢圓計
- "ellipsoid,oblate" in Chinese : 扁橢球
- "ellipsometric analysis" in Chinese : 橢圓分析
- "ellipsoidinidae" in Chinese : 橢球蟲科
- "ellipsometry" in Chinese : 橢率測量術(shù); 橢圓對稱法; 橢圓對源; 橢圓光度法; 橢圓計測量; 橢圓率測 ...
- "ellipsoidina" in Chinese : 橢球蟲
Examples
- Mathcad applied to testing of the optical constants for thin films with ellipsometer
Mathcad在橢圓偏振儀測定薄膜光學(xué)常數(shù)中的應(yīng)用 - The thickness , extinction and reflection coefficients of the plct ( x ) thin films with variant layers were measured by ellipsometer
運用橢圓偏振儀測定了不同層數(shù)的薄膜厚度、消光系數(shù)、折射率。 - The refractive index ( at 632 . 8nm ) of cbn thin film with 92 . 8 % cubic phase content is measured to be2 . 19 by ellipsometer
用橢偏儀測得,對于波長為632 . 8nm的光,立方相含量為92 . 8的氮化硼薄膜的折射率為2 . 19 。 - The microstructures of the c60 films were studied with scanning electric microscope ( sem ) ; and the optical constants ( including absorption spectrunu refractive index and dielectric function ) of c60 films were measured with the ellipsometer
常溫和77k溫度8襯底上c60膜的制備,以及這兩種薄膜的表面結(jié)構(gòu)及光學(xué)性質(zhì)的比較研究。光學(xué)參數(shù)主要由橢偏儀測量。 - Sem was used to observe the surface and the cross section of the films . index of refractive was derived from the ellipsometer . raman spectroscopy and xps were used to analyze the structure and composition of the films
用sem分析了薄膜的斷面形態(tài),在橢偏儀上測得其折射率,并對薄膜進行了raman光譜、 xps分析,在沒有極化的條件下進行了二階非線性maker條紋檢測。 - Their structures and optical properties were compared and analyzed . 2 the silver films were prepared at the room temperature and 77k on glass substrates . the microstructures and optical properties of the ag films were studied with the xrd , sem and ellipsometer , respectively
常溫和77k溫度玻璃襯底上金屬( ag 、 cu )薄膜的制備,以及常溫和77k玻璃襯底上ag薄膜的表面結(jié)構(gòu)及光學(xué)性質(zhì)的比較研究。 - 3 . the low dielectric silicate films were prepared by using poss sol - gel from hydrolyzation and condensation of y - methyl acryloyloxy propyl - triethoxysilane as template , and characterized by afm , bet and ellipsometer . a film with dielectric constant as low as 2 . 7 was obtained
3 、利用- (甲基丙稀酰氧)丙基三甲氧基硅烷水解縮和得到的poss溶膠作為模板劑制備得到了低介電薄膜材料,討論了旋膜轉(zhuǎn)速對薄膜厚度的影響。 - At last , the designed hr phase retardance films are produced by use of the e - beam evaporation equipment , then the phase retardance and the reflection of it are measured by lambda 900 spectrophotometer and the type of m - 2000ui ellipsometer . and the error of hr phase retardance film is analyzed
在此膜系的基礎(chǔ)上,通過對最外面幾層薄膜厚度的優(yōu)化設(shè)計,最終設(shè)計出了45入射、對632 . 8nm和1315nm雙波長高反,并在1315nm處有180和90位相延遲的高反射膜系。 - In this work , the author gave full - scale introduction for nano - materials about its structure and specialty , the application in practice and the progress in our country at present etc ; introduced and discussed the preparation , the structure and character of several nano - films ; explained in details the theory of the ellipsometer which measures the optical constants of the materials
本文對納米材料的定義、結(jié)構(gòu)特征及應(yīng)用和我國納米材料發(fā)展的現(xiàn)狀作了較全面的介紹;對薄膜的制備、結(jié)構(gòu)、特征進行了介紹和討論;還詳細介紹了測量材料光學(xué)性質(zhì)的儀器? ?橢圓光譜偏振儀的結(jié)構(gòu)原理及數(shù)據(jù)的處理方法。 - The measure of ellipsometer shows : the refractive index value of c60 cluster films in gas atmosphere is smaller than that of vacuum c60 films ( our measurement result is 1 . 94 ) and refractive index value of c60 cluster films in ar is larger than that in n2 . both refractive index values are nearly the same in lower pressure ( about 1 . 46 ) , but decrease with increasing gas pressure
橢偏儀測量表明:氣氛條件下制備的c60薄膜的折射率n比在真空條件下制備的c60薄膜的折射率( 1 . 94 )??;在低壓強條件下,不同氣氛中制備的樣品的折射率也幾乎相等;在一定的壓強范圍內(nèi),折射率隨著壓強的增大而減小。
- More examples: 1 2
Other Languages
- "ellipsometer" meaning in Japanese: {名} : 《光學(xué)》エリプソメーター、偏光解析器{へんこう かいせきき}、偏光楕円率計測器{へんこう だえん りつ ...
- "ellipsometer" meaning in Russian: эллипсометр ( для измерения толщины тонких плёнок )
Related
"ellipsometer oxide thickness measurement" in Chinese, "ellipsoidina" in Chinese, "ellipsoidinidae" in Chinese, "ellipsoid,oblate" in Chinese, "ellipsoid,prolate" in Chinese, "ellipsolithus" in Chinese, "ellipsometern" in Chinese, "ellipsometers" in Chinese, "ellipsometric analysis" in Chinese, "ellipsometry" in Chinese,
Neighbors
What is the meaning of ellipsometer in Chinese and how to say ellipsometer in Chinese? ellipsometer Chinese meaning, ellipsometer的中文,ellipsometer的中文,ellipsometer的中文,translation, pronunciation, synonyms and example sentences are provided by ichacha.net.