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ellipsometer in Chinese

Pronunciation:
How to pronounce "ellipsometer""ellipsometer" in a sentence

Translationmobile phoneMobile

  • 偏振光橢圓計
  • 偏振光橢圓率測量儀
  • 橢率計
  • 橢圓率計
  • 橢圓偏振計

Examples

  • Mathcad applied to testing of the optical constants for thin films with ellipsometer
    Mathcad在橢圓偏振儀測定薄膜光學(xué)常數(shù)中的應(yīng)用
  • The thickness , extinction and reflection coefficients of the plct ( x ) thin films with variant layers were measured by ellipsometer
    運用橢圓偏振儀測定了不同層數(shù)的薄膜厚度、消光系數(shù)、折射率。
  • The refractive index ( at 632 . 8nm ) of cbn thin film with 92 . 8 % cubic phase content is measured to be2 . 19 by ellipsometer
    用橢偏儀測得,對于波長為632 . 8nm的光,立方相含量為92 . 8的氮化硼薄膜的折射率為2 . 19 。
  • The microstructures of the c60 films were studied with scanning electric microscope ( sem ) ; and the optical constants ( including absorption spectrunu refractive index and dielectric function ) of c60 films were measured with the ellipsometer
    常溫和77k溫度8襯底上c60膜的制備,以及這兩種薄膜的表面結(jié)構(gòu)及光學(xué)性質(zhì)的比較研究。光學(xué)參數(shù)主要由橢偏儀測量。
  • Sem was used to observe the surface and the cross section of the films . index of refractive was derived from the ellipsometer . raman spectroscopy and xps were used to analyze the structure and composition of the films
    用sem分析了薄膜的斷面形態(tài),在橢偏儀上測得其折射率,并對薄膜進行了raman光譜、 xps分析,在沒有極化的條件下進行了二階非線性maker條紋檢測。
  • Their structures and optical properties were compared and analyzed . 2 the silver films were prepared at the room temperature and 77k on glass substrates . the microstructures and optical properties of the ag films were studied with the xrd , sem and ellipsometer , respectively
    常溫和77k溫度玻璃襯底上金屬( ag 、 cu )薄膜的制備,以及常溫和77k玻璃襯底上ag薄膜的表面結(jié)構(gòu)及光學(xué)性質(zhì)的比較研究。
  • 3 . the low dielectric silicate films were prepared by using poss sol - gel from hydrolyzation and condensation of y - methyl acryloyloxy propyl - triethoxysilane as template , and characterized by afm , bet and ellipsometer . a film with dielectric constant as low as 2 . 7 was obtained
    3 、利用- (甲基丙稀酰氧)丙基三甲氧基硅烷水解縮和得到的poss溶膠作為模板劑制備得到了低介電薄膜材料,討論了旋膜轉(zhuǎn)速對薄膜厚度的影響。
  • At last , the designed hr phase retardance films are produced by use of the e - beam evaporation equipment , then the phase retardance and the reflection of it are measured by lambda 900 spectrophotometer and the type of m - 2000ui ellipsometer . and the error of hr phase retardance film is analyzed
    在此膜系的基礎(chǔ)上,通過對最外面幾層薄膜厚度的優(yōu)化設(shè)計,最終設(shè)計出了45入射、對632 . 8nm和1315nm雙波長高反,并在1315nm處有180和90位相延遲的高反射膜系。
  • In this work , the author gave full - scale introduction for nano - materials about its structure and specialty , the application in practice and the progress in our country at present etc ; introduced and discussed the preparation , the structure and character of several nano - films ; explained in details the theory of the ellipsometer which measures the optical constants of the materials
    本文對納米材料的定義、結(jié)構(gòu)特征及應(yīng)用和我國納米材料發(fā)展的現(xiàn)狀作了較全面的介紹;對薄膜的制備、結(jié)構(gòu)、特征進行了介紹和討論;還詳細介紹了測量材料光學(xué)性質(zhì)的儀器? ?橢圓光譜偏振儀的結(jié)構(gòu)原理及數(shù)據(jù)的處理方法。
  • The measure of ellipsometer shows : the refractive index value of c60 cluster films in gas atmosphere is smaller than that of vacuum c60 films ( our measurement result is 1 . 94 ) and refractive index value of c60 cluster films in ar is larger than that in n2 . both refractive index values are nearly the same in lower pressure ( about 1 . 46 ) , but decrease with increasing gas pressure
    橢偏儀測量表明:氣氛條件下制備的c60薄膜的折射率n比在真空條件下制備的c60薄膜的折射率( 1 . 94 )??;在低壓強條件下,不同氣氛中制備的樣品的折射率也幾乎相等;在一定的壓強范圍內(nèi),折射率隨著壓強的增大而減小。
  • More examples:  1  2

Other Languages

  • "ellipsometer" meaning in Japanese: {名} : 《光學(xué)》エリプソメーター、偏光解析器{へんこう かいせきき}、偏光楕円率計測器{へんこう だえん りつ ...
  • "ellipsometer" meaning in Russian: эллипсометр ( для измерения толщины тонких плёнок )
What is the meaning of ellipsometer in Chinese and how to say ellipsometer in Chinese? ellipsometer Chinese meaning, ellipsometer的中文,ellipsometer的中文ellipsometer的中文,translation, pronunciation, synonyms and example sentences are provided by ichacha.net.