The scanning electron microscope provides information on chemical composition by use of x-ray spectrometer attachments . 掃描電子顯微鏡能利用x射線譜儀的附件來提供化學(xué)組份的信息。
Imaging signals used in scanning electron microscope 掃描電子顯微鏡成像信號(hào)分析
Verification regulation of scanning electron microscope 掃描電子顯微鏡試行檢定規(guī)程
Low cost high resolution scanning electron microscope 實(shí)用高分辨率掃描電鏡
Hrsem high resolution scanning electron microscope 高分辨率掃描電子顯微鏡
High performance scanning electron microscope 高性能掃描電子顯微鏡
Biosem biological scanning electron microscope 生物掃描電子顯微鏡
Tsem transmission scanning electron microscope 發(fā)射電子掃描顯微鏡
Field emission scanning electron microscope 場(chǎng)發(fā)射掃描電子顯微鏡
Analytical method of rock sample by scanning electron microscope 巖石樣品掃描電子顯微鏡分析方法
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with electrons in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition.