We also develop a new word - level fault parallel fs algorithin for synchronous sequential circuits 接著又開發(fā)了一個(gè)新的單機(jī)字級(jí)故障并行fs算法。
Optimize synchronous sequential circuit with retiming was introduced by leiserson and saxe in 1983 , and retiming optimizational algorithm was summarized comprehensively in 1991 Leiserson和saxe于1983年提出了利用重定時(shí)優(yōu)化同步時(shí)序電路,并于1991年對(duì)重定時(shí)優(yōu)化算法做了全面的總結(jié)。
In order to eliminate the sequence conflict of synchronous sequential circuit and shorten the designable time of integrated circuits , the algorithms of retiming is deeply researched in this paper 本文對(duì)重定時(shí)算法進(jìn)行了深入研究,目的在于消除同步時(shí)序電路的時(shí)序沖突,從而縮短集成電路的設(shè)計(jì)時(shí)間。
Base on the existing synchronous sequential circuits fault simulator - hope , the test vector generation method of sequential circuits based on ant algorithm is systematically researched firstly 本文在同步時(shí)序電路故障模擬器? hope的基礎(chǔ)上,率先對(duì)基于螞蟻算法的時(shí)序電路測(cè)試矢量生成方法作了系統(tǒng)的開拓性研究。
As emphasis , we propose a new backward width - flrst search circuit partitioning method with flip - flop as core for synchronous sequential circuits . and then based on it , we develop a new circuit parallel tg algorithm 最后重點(diǎn)對(duì)電路并行方法進(jìn)行了研究,提出了一種新的以觸發(fā)器為核且消除大功能塊之間反饋的寬度優(yōu)先反向搜索同步時(shí)序電路劃分方法。
Test vector generation based on ant algorithm is presented and implemented , the pheromone computation formula for sequential circuits and status transfer rules are given , and the test results are compared with the results of the other existing test generators - hitec , gatest , cris , digate and strategate , based on standard sequential circuits iscas ' 89 and other synchronous sequential circuits 提出并實(shí)現(xiàn)了基于螞蟻算法的測(cè)試矢量生成,給出了針對(duì)時(shí)序電路測(cè)試矢量生成的信息素計(jì)算公式和狀態(tài)轉(zhuǎn)移規(guī)則。在iscas ’ 89標(biāo)準(zhǔn)時(shí)序電路和幾個(gè)同步時(shí)序電路上實(shí)現(xiàn)了測(cè)試生成,并將生成結(jié)果和其它現(xiàn)有測(cè)試生成器( hitec , gatest , cris , digate , strategate )的生成結(jié)果作了比較、分析。