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scanning probe microscopy中文是什么意思
- 中文翻譯
- 造句
- 描探微
- 掃描探針顯微鏡
- 掃描探針顯微術
- scanning n. 1.細看，細察，審視。 2.【電視】掃描，掃掠,搜 ...
- probe n. 1.【醫(yī)學】探針；探示器；取樣器；【物理學】試探電 ...
- microscopy n. 顯微鏡學；顯微鏡使用術。
- scanning probe microscopy(spm) 掃描顯微探針
- scanning microscopy 掃描顯微術
- electron-probe microscopy 電子探針顯微鏡術
- confocal laser scanning microscopy 共聚焦顯微鏡; 共軛焦顯微鏡
- electron scanning microscopy 掃描電子顯微術
- laser scanning confocal microscopy 激光共焦點掃描顯微鏡
- scanning electron microscopy 電子掃描顯微術; 掃描電鏡檢查; 掃描電子顯微鏡檢查法; 掃描電子顯微鏡檢術; 掃描電子顯微鏡術; 掃描電子顯微術
- scanning electron microscopy study 掃描電子顯微鏡研究
- scanning electronic microscopy 【物理學】掃描電子顯微術。
- scanning immuno-electron microscopy 掃描免疫電子顯微鏡檢查
- scanning lorentz microscopy 洛倫茲掃描顯微術
- scanning photo-acoustic microscopy 光掃描-聲學顯微鏡
- scanning tunnel microscopy 掃描隧道顯微術
- scanning tunneling microscopy 掃描隧道型顯微鏡學
- scanning-electron microscopy 掃描電子顯微術
- clsm confocal laser scanning microscopy 共焦激光掃描顯微鏡的縮寫
- scanning field probe method 掃描場探針法
- scanning probe micro scope 低真空走查電子顯微鏡
- probe n. 1.【醫(yī)學】探針；探示器；取樣器；【物理學】試探電極。 2.【醫(yī)學】(對傷處等的)針探，探查；刺探；探索；試探；查究 (into); 〔美國〕調查；試樣。 3.【航空】(飛機)空中加油管。 4.【宇宙空間技術】探測器；探測飛船。 a lunar probe 月球探測器。 vt. 1.用探針[探測器]探查。 2.刺探；調查，探查，查究。 probe a matter to the bottom 徹底調查一件事。 vi. (用探針)探查；探索；查究，深查 (into)。 probe deeply into 深入調查。
- scanning n. 1.細看，細察，審視。 2.【電視】掃描，掃掠,搜索。
- acoustic microscopy 聲納顯微術; 聲顯微術
- anatomical microscopy 解剖顯微鏡
- The applications of scanning probe microscopy a review
掃描探針顯微術的應用綜述 - Scanning probe microscopy based nanotechnology
基于掃描探針顯微鏡的納米技術 - Scanning probe microscopy of combined snom sfm cantilever probe
結合的掃描探測顯微鏡 - Scanning probe microscopy ( spm ) related surface science and nanotechnology
與掃描探針有關的表面科學和納米技術 - Scanning probe microscopy fg 8ou
掃描探針顯微鏡 - Scanning probe microscopy , spm
掃描探針顯微鏡 - Scanning probe microscopy
掃描探針顯微鏡 - Standard practice for measuring and reporting probe tip shape in scanning probe microscopy
掃描探測顯微鏡探頭測量和報告的標準實施規(guī)程 - Scanning probe microscopy ( spm ) has evolved into a powerful tool for imaging with nanometer - scale resolution and analyzing a variety of surface in the past two decades , which is advantageous to be done in vacuum , in atmosphere , or in liquid
掃描探針顯微鏡( spm )是近二十年來發(fā)展起來的一個強有力的表面分析工具，具有納米級的分辨率、制樣簡單、可在不同的環(huán)境下(真空、大氣、液體)進行觀察等優(yōu)點。 - The branches of nano - technology include nano - physics , nano - chemistry , nano - electronics , nano - material science , nano - biology , nano - mechanics and narto - measurements , etc . with the development of nano - technology , scanning probe microscopy ( spm ) , especially atomic force microscopy ( afm ) , has been the most widely demanded and applied tools for researchers to pursue more ambitious goals , and has actually become the indispensable instruments for nano - scientists and engineers
納米技術正在不斷滲透到現代科學技術的各個領域，形成了許許多多與納米技術相關的新興學科，如納米物理學、納米化學、納米電子學、納米材料學、納米生物學、納米機械學與納米量測學等。掃描隧道顯微鏡( stm )與原子力顯微鏡( afm )等是納米技術發(fā)展的重要基礎，也是納米科技工作者必不可少的研究工具，其中又以afm需求更大，應用領域更為廣泛。
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
詳細百科解釋
- scanning probe microscopyとは意味：走査型｛そうさ がた｝プローブ顕微鏡｛けんびきょう｝
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