fault coverage中文是什么意思

發(fā)音:

中文翻譯
造句

故障范圍
故障覆蓋率
故障概括率
故障檢測范圍；錯誤檢測范圍
故障識別比

fault n. 1.過失，過錯；罪過，責任。 2.缺點，缺陷，瑕疵 ...
coverage n. 范圍，規(guī)模，總額；〔美國〕保險額；保證金，現(xiàn)金準備 ...
coverage fault 故障檢測范圍
coverage n. 范圍，規(guī)模，總額；〔美國〕保險額；保證金，現(xiàn)金準備；〔美國〕(新聞)報導(范圍)；【植物；植物學】優(yōu)勢度。 coverage diagram 【航空】搜索范圍。
at fault 感到困惑, 有故障; 有錯; 有過失; 有毛病; 罪有應得
fault n. 1.過失，過錯；罪過，責任。 2.缺點，缺陷，瑕疵。 3.(獵狗的)失去嗅跡。 4.【電學】故障，誤差；漏電；【地質(zhì)學；地理學】斷層。 5.【網(wǎng)球】發(fā)球出界；犯規(guī)。 Faults are thick where love is thin. 〔諺語〕一朝情義淡，樣樣不順眼。 fault detection 【機械工程】探傷。 The fault is his own. 這是他自己的錯。 a grave fault in a theory 理論上的重大缺陷。 a fault in the machine 機械故障。 image fault 【物理學】像差，影像失真。 numerical faults 數(shù)值誤差。 a fault on the right side 因禍得福。 be at fault 1. (獵犬追捕獵物等時)失去嗅跡，躊躇不前；不知所措，正在為難。 2. 出毛病，有故障。 3. ＝ in fault (My memory is at fault . 我想不起來了)。 find fault in 看出…缺點。 find fault with 找…的岔子。 have no fault to find with 無錯可尋。 hit off a fault (獵狗)聞出(曾一度錯失的)嗅跡。 in fault 有過錯，有責任 (Who is in fault 是誰的不是？)。 to a fault 過度，極端 (He is kind to a fault. 他過分老實)。 whip a fault out of sb. 鞭打某人使之改過。 with all faults 不保證商品沒有缺點。 without fault 〔古語〕無誤，確實。 vi. 1.【地質(zhì)學；地理學】產(chǎn)生斷層；有斷層余跡。 2.發(fā)球出界；犯規(guī)。 3.〔方言〕責備，挑剔。 4.〔古語〕犯錯誤，做錯。 vt. 1.找…的岔子，挑剔；〔方言〕責備。 2.【地質(zhì)學；地理學】使產(chǎn)生斷層。 3.把…做錯。 He faulted my speech in two ways. 他認為我的講話有兩點不妥。 fault one's performance 表演發(fā)生失誤。
in fault 有過錯
no fault 無過失
to a fault 過分地
increasing coverage extending coverage 保險憑證
absorbent coverage 吸收性復蓋層
acquisitionn coverage 探測范圍
addition coverage 附加覆蓋
additional coverage 增加承保范圍
aerial coverage 航攝范圍
air coverage 航空攝影范圍
aircraft coverage 航天器感測范圍
airphoto coverage 航空攝影范圍
ambulance coverage 救護服務覆蓋范圍
angle coverage 鏡頭取景角度
angle of coverage 視場角; 視角
angular coverage 覆蓋角; 扇形作用區(qū); 視界
antibiotic coverage 抗生素作用范圍
anticoagulant coverage 抗凝劑作用范圍
area coverage 覆蓋面積; 覆蓋區(qū)域; 區(qū)域范圍

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例句與用法

As an enhancement of these methods , current testing can increase the fault coverage and make higher the reliability of ics
作為這些方法的一個補充，電流測試方法能夠提高故障的覆蓋率，提高產(chǎn)品的可靠性。
And , when coupled with functional testing , the fault coverage for the entire process is as good as or better than in - circuit testing alone
加上功能測試，這個過程中檢測到的故障率要比單獨進行在線測試故障發(fā)現(xiàn)率大。
The transient power supply current ( iddt ) testing can detect some faults undetectable by any other test method , and increase fault coverage
瞬態(tài)電流測試方法可以測試一些其他測試方法無法檢測的故障，進一步提高故障覆蓋率。
Through the simulative experiments about iddq detecting bridge faults in cmos and bicmos circuits , the fault coverage of iddq can be estimated
并對cmos電路與bicmos電路的橋接故障作了iddq檢測仿真實驗,分析了iddq檢測的故障覆蓋率。
In this paper we use the bist in the testing of the ssrams in estarl according to the characteristics of the structure and get almost 100 % fault coverage
本文針對estar1內(nèi)部ssram的結構特點，實現(xiàn)了存儲器自測試，得到了將近100的故障覆蓋率。
Because most of the faults found at board test are manufacturing defects , fault coverage for mda tests is nearly as good as fault coverage for in - circuit tests
因為在板級測試中發(fā)現(xiàn)的大部分故障都是生產(chǎn)缺陷，生產(chǎn)缺陷分析測試到的故障幾乎都可以覆蓋在線測試所發(fā)現(xiàn)的問題。
The conclusion is that by using ant algorithm , the fault coverage about near half standard circuits is best ; and the generation speed is very higher than strategate ' s
與現(xiàn)有測試生成器相比，基于螞蟻算法的測試矢量生成結果中，有近一半的標準電路獲得了最高的故障覆蓋率；在生成速度方面遠高于strategate等算法。
The dynamic power supply current ( iddt ) is a new window through which we can observe the switching activities in digital circuits . iddt testing methods make possible further increasing the fault coverage
動態(tài)電流提供了一個觀測電路內(nèi)部開關性能的新的窗口，動態(tài)電流測試方法為進一步提高故障覆蓋率提供了可能。
The experimental results illuminate the hierarchical test generation algorithm can greatly decrease the scale of test sets ( about 66 % ) , but the fault coverage and time performance are lower than gate - level test generation
實驗數(shù)據(jù)表明分層測試產(chǎn)生算法能大大壓縮電路測試集（約為66 ），而故障覆蓋率有略微下降，時間性能也有些許降低。
These new methods adopt the circuit information contained in the power supply line current to realize the fault diagnosis . it can increase the fault coverage , reduce testing cost and improve the quality and reliability of ics
它通過從電源電流信號中提取有效的信息來進行故障診斷,能夠提高故障覆蓋率,降低測試成本并提高集成電路產(chǎn)品的質(zhì)量與可靠性。

更多例句： 1 2

百科解釋

Fault coverage refers to the percentage of some type of fault that can be detected during the test of any engineered system. High fault coverage is particularly valuable during manufacturing test, and techniques such as Design For Test (DFT) and automatic test pattern generation are used to increase it.

詳細百科解釋